MEASUREMENT OF MINORITY-CARRIER CAPTURE CROSS-SECTIONS AND APPLICATION TO GOLD AND PLATINUM IN SILICON

被引：21
作者：
BROTHERTON, SD
BRADLEY, P
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 03期
关键词：
D O I：
10.1063/1.330655
中图分类号：
O59 [应用物理学];
学科分类号：
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页码：1543 / 1553
页数：11
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