DETERMINATION OF DIELECTRIC PERMITTIVITY AND THICKNESS OF A METAL LAYER FROM A SURFACE-PLASMON RESONANCE EXPERIMENT

被引：49
作者：
DEBRUIJN, HE
KOOYMAN, RPH
GREVE, J
机构：
[1] University of Twente, Department of Applied Physics, Enschede, 7500
来源：
APPLIED OPTICS | 1990年 / 29卷 / 13期
关键词：
Dielectric permittivity; Metal layer; Surface plasmon resonance; Thickness;
D O I：
10.1364/AO.29.001974
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
In this paper we present a fast method for the determination of dielectric permittivity ϵ = —ϵr + iϵi,- and thickness d of metal layers from surface plasmon resonance reflection curves. The method is an iteration process using starting parameters derived directly from a reflection curve. The method is tested with simulations and is applied to experimental results. Accuracies reached for silver layers between 25-100 nm and gold layers between 40-75 nm are better than: ϵr ±1%; ϵi- ±13% and d ±8%. © 1990 Optical Society of America.
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页码：1974 / 1978
页数：5
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