DEVICE FOR STUDIES OF SECONDARY-ELECTRON STATISTICS IN EMISSION PROCESSES

被引：0
|
作者：
TROFIMCHUK, NN
LORIKYAN, MP
KAVALOV, RL
机构：
来源：
PRIBORY I TEKHNIKA EKSPERIMENTA | 1974年 / 05期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：149 / 151
页数：3
相关论文
共 50 条
  • [41] SECONDARY-ELECTRON EMISSION OF DOPED PZT CERAMICS
    DIXIT, AV
    RAJOPADHYE, NR
    BHORASKAR, SV
    JOURNAL OF MATERIALS SCIENCE, 1986, 21 (08) : 2798 - 2802
  • [42] SECONDARY-ELECTRON EMISSION OF AMORPHOUS ALUMINA FILMS
    VERMA, RL
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1974, 12 (11) : 782 - 783
  • [43] SECONDARY-ELECTRON EMISSION OF SPUTTERED ALUMINA FILMS
    RAJOPADHYE, NR
    BHORASKAR, SV
    PRAMANA, 1985, 25 (03) : 327 - 334
  • [44] SECONDARY-ELECTRON EMISSION FROM GLASS AND CERAMICS
    HUSTON, RL
    SNYDER, D
    DUNN, BS
    MACKENZIE, JD
    AMERICAN CERAMIC SOCIETY BULLETIN, 1976, 55 (04): : 423 - 423
  • [45] SPIN-DEPENDENT SECONDARY-ELECTRON EMISSION
    ERBUDAK, M
    MAURER, W
    MULLER, N
    RAVANO, G
    HELVETICA PHYSICA ACTA, 1984, 57 (02): : 215 - 215
  • [46] THE SECONDARY-ELECTRON EMISSION COEFFICIENT OF DISORDERED SURFACES
    BOUCHARD, C
    CARETTE, JD
    SURFACE SCIENCE, 1980, 100 (01) : 241 - 250
  • [47] SECONDARY-ELECTRON EMISSION MULTIPLIERS AS PARTICLE DETECTORS
    BAUMGARTNER, WE
    HUBER, WK
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (05): : 321 - 330
  • [48] A STUDY OF SECONDARY-ELECTRON EMISSION IN INSULATORS AND SEMICONDUCTORS
    GRAIS, KI
    BASTAWROS, AM
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (07) : 5239 - 5242
  • [49] Secondary-electron emission from complex surfaces
    Treloar, LRG
    PROCEEDINGS OF THE PHYSICAL SOCIETY, 1937, 49 : 392 - 408
  • [50] SECONDARY-ELECTRON EMISSION OF THE SYSTEM [W]-TH
    BRONSHTEIN, IM
    KARASIK, BS
    KHINICH, II
    RADIOTEKHNIKA I ELEKTRONIKA, 1983, 28 (10): : 2075 - 2078
12345