INSITU OBSERVATION OF ANISOTROPIC STRAIN RELAXATION IN EPITAXIAL FE (110) FILMS ON MO (110)

被引：34

作者：

CLEMENS, BM ^{[1
]}

OSGOOD, R ^{[1
]}

PAYNE, AP ^{[1
]}

LAIRSON, BM ^{[1
]}

BRENNAN, S ^{[1
]}

WHITE, RL ^{[1
]}

NIX, WD ^{[1
]}

机构：

[1] STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94309

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1993年 / 121卷 / 1-3期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-8853(93)91143-U

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In-situ grazing incidence X-ray diffraction was used to measure the lattice parameter as a function of thickness for epitaxial Fe (110) films on Mo (110). A large, thickness-dependent, anisotropic in-plane strain was observed. This strain behavior is explained with an equilibrium misfit dislocation model incorporating anisotropic elasticity. The magnetostrictive anisotropy expected from this strain has nearly linear behavior in reciprocal film thickness and thus could be mistaken for a surface anisotropy.

引用

页码：37 / 41

页数：5

共 19 条

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