MEASUREMENT OF NONDEGENERATE NONLINEARITIES USING A 2-COLOR Z-SCAN

被引:167
作者
SHEIKBAHAE, M
WANG, J
DESALVO, R
HAGAN, DJ
VANSTRYLAND, EW
机构
[1] Center for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, FL
关键词
D O I
10.1364/OL.17.000258
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A simple dual-wavelength (two-color) Z-scan geometry is demonstrated for measuring nonlinearities at frequency omega(p) owing to the presence of light at omega(e). This technique gives the nondegenerate two-photon absorption (2PA) coefficient beta(omega(p); omega(e)) and the nondegenerate nonlinear refractive index n2(omega(p); omega(e)), i.e., cross-phase modulation. We demonstrate this technique on CS2 for n2 and on ZnSe where 2PA and n2 are present simultaneously.
引用
收藏
页码:258 / 260
页数:3
相关论文
共 10 条
[1]   NONLINEAR REFRACTIVE-INDEX MEASUREMENTS OF GLASSES USING 3-WAVE FREQUENCY MIXING [J].
ADAIR, R ;
CHASE, LL ;
PAYNE, SA .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1987, 4 (06) :875-881
[2]   COMPLEX INTENSITY-DEPENDENT INDEX OF REFRACTION FREQUENCY BROADENING OF STIMULATED RAMAN LINES AND STIMULATED RAYLEIGH SCATTERING [J].
BLOEMBER.N ;
LALLEMAN.P .
PHYSICAL REVIEW LETTERS, 1966, 16 (03) :81-+
[3]  
Butcher P. N., 1990, ELEMENTS NONLINEAR O
[4]   MEASUREMENTS OF NONDEGENERATE OPTICAL NONLINEARITY USING A 2-COLOR SINGLE BEAM METHOD [J].
MA, H ;
GOMES, ASL ;
DEARAUJO, CB .
APPLIED PHYSICS LETTERS, 1991, 59 (21) :2666-2668
[5]   FEMTOSECOND OPTICAL KERR STUDIES ON THE ORIGIN OF THE NONLINEAR RESPONSES IN SIMPLE LIQUIDS [J].
MCMORROW, D ;
LOTSHAW, WT ;
KENNEYWALLACE, GA .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1988, 24 (02) :443-454
[6]   SENSITIVE MEASUREMENT OF OPTICAL NONLINEARITIES USING A SINGLE BEAM [J].
SHEIKBAHAE, M ;
SAID, AA ;
WEI, TH ;
HAGAN, DJ ;
VANSTRYLAND, EW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1990, 26 (04) :760-769
[7]   DISPERSION OF BOUND ELECTRONIC NONLINEAR REFRACTION IN SOLIDS [J].
SHEIKBAHAE, M ;
HUTCHINGS, DC ;
HAGAN, DJ ;
VANSTRYLAND, EW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1991, 27 (06) :1296-1309
[8]  
SHEIKBAHAE M, 1991, OSA TECHNICAL DIGEST, V11
[9]  
SHEIKBAHAE M, 1991, OSA 1991 TECHNICAL D, V15
[10]  
VANSTRYLAND EW, 1982, CHEM PHYS, V23, P368