SYSTEMS APPROACH TO SEMICONDUCTOR SLICING TO IMPROVE WAFER QUALITY AND PRODUCTIVITY

被引：0

|

作者：

KACHAJIAN, GS

机构：

来源：

SOLID STATE TECHNOLOGY | 1972年 / 15卷 / 09期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：59 / +

页数：1

相关论文

共 50 条

[21] IMPROVE QUALITY WITHOUT SACRIFICING PRODUCTIVITY
NAIR, P
HYDROCARBON PROCESSING, 1992, 71 (05): : 45 - 45
[22] FURNACE ATMOSPHERES IMPROVE PRODUCTIVITY AND QUALITY
不详
ANTI-CORROSION METHODS AND MATERIALS, 1995, 42 (04) : 27 - 28
[23] Cutters, inserts improve productivity, quality
不详
MANUFACTURING ENGINEERING, 2005, 134 (06): : 59 - 59
[24] Hybrid data mining approach for pattern extraction from wafer bin map to improve yield in semiconductor manufacturing
Hsu, Shao-Chung
Chien, Chen-Fu
INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS, 2007, 107 (01) : 88 - 103
[25] An Optimization Approach for Semiconductor Wafer Fabrication Scheduling Problem
Cao Zheng-cai
Qia Fei
Wu Qi-di
MANUFACTURING SCIENCE AND ENGINEERING, PTS 1-5, 2010, 97-101 : 2465 - +
[26] Systems approach to productivity
Alvord, Brice D.
SME Technical Paper (Series) MM, 1989, : 89 - 598
[27] An integrated approach to improve oilfield productivity
Murray, R
WORLD OIL, 1998, 219 (01) : 42 - 45
[28] Single wafer management systems and bare wafer storage as key to increased yield and productivity
Ritzmann, H
2005 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop: Advancing Semiconductor Manufacturing Excellence, 2005, : 91 - 95
[29] Using a systematic organization change approach to improve productivity and application with a case study on semiconductor manufacturing company
Su, C.-T. (ctsu@mx.nthu.edu.tw), 1600, Chinese Society for Quality (19):
[30] AN INTEGRATED QUALITY SYSTEMS-APPROACH TO QUALITY AND PRODUCTIVITY IMPROVEMENT IN CONTINUOUS MANUFACTURING PROCESSES
DOOLEY, KJ
KAPOOR, SG
DESSOUKY, MI
DEVOR, RE
JOURNAL OF ENGINEERING FOR INDUSTRY-TRANSACTIONS OF THE ASME, 1986, 108 (04): : 322 - 327

← 1 2 3 4 5 →