IMAGING OF SURFACES WITH EXOELECTRON MICROSCOPE

被引：0
|
作者：
BRAUNLICH, P
ROSENBLUM, B
CARRICO, JP
HIMMEL, L
ROL, PK
机构：
[1] BENDIX RES LABS, SOUTHFIELD, MI 48076 USA
[2] WAYNE STATE UNIV, DEPT CHEM ENGN & MAT SCI, DETROIT, MI 48202 USA
来源：
APPLIED PHYSICS LETTERS | 1973年 / 22卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：61 / 63
页数：3
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