Infrared interferometry based measurement of asphero diffractive optical surface

被引:1
作者
Ghosh, Amitava [1 ,2 ]
Chandra, Kanchan [1 ]
Pandey, Neeraj [1 ]
Khare, Sudhir [1 ]
Mohan, D. [2 ]
机构
[1] Instruments Res & Dev Estab, Dehra Dun 248008, India
[2] GJU Univ, Hisar, Haryana, India
来源
JOURNAL OF OPTICS-INDIA | 2018年 / 47卷 / 03期
关键词
Infrared interferometry; Metrology; Diffractive optics;
D O I
10.1007/s12596-017-0440-z
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Diffractive features on lenses are widely used in thermal imaging instruments for chromatic aberration correction and provide a good tool to optical designer for minimizing aberrations and designing a compact imaging system. The measurement of diffractive surface is a challenging task and a standard method used to qualify a diffractive lens is the sag deviation from the designed lens profile. Imperfections in the manufacturing of the diffractive feature may cause scattering and performance loss. In this paper, a method is presented to measure the three dimensional surface profile of a diffractive optical surface using infrared interferometry.
引用
收藏
页码:295 / 300
页数:6
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