Structural properties of cubic MnTe layers grown by MBE

被引:59
作者
Janik, E [1 ]
Dynowska, E [1 ]
BakMisiuk, J [1 ]
Leszczynski, M [1 ]
Szuszkiewicz, W [1 ]
Wojtowicz, T [1 ]
Karczewski, G [1 ]
Zakrzewski, AK [1 ]
Kossut, J [1 ]
机构
[1] POLISH ACAD SCI,HIGH PRESSURE RES CTR,WARSAW,POLAND
关键词
molecular beam epitaxy; lattice parameters; X-ray diffraction; Raman scattering;
D O I
10.1016/0040-6090(95)06632-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the growth of zinc-blende MnTe on (001) GaAs substrates by MBE. Layers with thickness up to 8 mu m were grown. The growth was performed for various ratios of Mn acid Te fluxes. For high values of the Te/Mn Bur ratio, Raman scattering spectra showed a presence of tellurium lines corresponding to crystalline tellurium. For low flux ratios the presence of Te precipitates was less evident. These results were confirmed by X-ray diffraction studies. The lattice parameter of cubic MnTe and its temperature dependence were determined by X-ray diffraction. From the analysis of the rocking curves, for various Bragg reflections, the fluctuations of the lattice parameter and mosaicity were separated out.
引用
收藏
页码:74 / 78
页数:5
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