共 5 条
- [1] ANDERSON RJ, 1971, APPL OPTICS, V7, P1605
- [2] DICKSON LD, AFALTR68141 TECH REP
- [3] DISKSON LD, 1979, OPT ENG, V1, P70
- [4] PEARSON JE, 1969, J OPT SOC AM, V11, P1440
- [5] SUZAKI Y, 1975, APPL OPTICS, V12, P2809
A NEW METHOD OF MEASURING MICROSPOT PARAMETERS IN A MAGNETOOPTIC STORAGE-SYSTEM
被引：0
作者：
RUAN, Y
CAO, DH
LI, MZ
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
|
1992年
/
31卷
/
2B期
关键词：
MAGNETOOPTIC DATA STORAGE;
MICROSIZED SPOT;
FREQUENCY ANALYSIS;
AMPLITUDE SPECTRAL DENSITY;
FOURIER TRANSFORM;
D O I：
暂无
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
On the basis of frequency analysis of magnetooptic signals, a new method to measure microsized spots is described. The method not only has high measuring accuracy and the ability of real-time measurement, but it is also simple. In this paper, several mathematical models to examine measuring error are developed. By theoretical analysis, for detection frequency of 0.6 MHz and spot radius of 0.5-mu-m, the relative error is within 0.032%.
引用
收藏
页码：554 / 556
页数：3
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