MAGNETIC FORCE MICROSCOPY - CURRENT STATUS AND FUTURE-TRENDS

被引：36

作者：

HARTMANN, U ^{[1
]}

GODDENHENRICH, T ^{[1
]}

HEIDEN, C ^{[1
]}

机构：

[1] FORSCHUNGSZENTRUM JULICH, INST THIN FILM & ION TECHNOL, W-5170 JULICH 1, GERMANY

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1991年 / 101卷 / 1-3期

关键词：

D O I：

10.1016/0304-8853(91)90750-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Magnetic force microscopy (MFM) is a scanned probe technique for imaging microfields near surfaces of magnetic media. This brief review summarizes the basic experimental techniques and gives a sample of the results obtained so far. The major strengths and limitations of MFM are emphasized and some open questions in contrast interpretation are addressed. Future trends and new fields of application are outlined.

引用

页码：263 / 270

页数：8

共 44 条

[1] THEORY OF MAGNETIC FORCE MICROSCOPE IMAGES [J].

ABRAHAM, DW ;

MCDONALD, FA .

APPLIED PHYSICS LETTERS, 1990, 56 (12) :1181-1183

[2] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274

[3] AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].

ALEXANDER, S ;

HELLEMANS, L ;

MARTI, O ;

SCHNEIR, J ;

ELINGS, V ;

HANSMA, PK ;

LONGMIRE, M ;

GURLEY, J .

JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167

[4] IMAGING OF TIP SAMPLE COMPLIANCE IN STM [J].

ANDERS, M ;

HEIDEN, C .

JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :643-650

[5] SCANNING TUNNELING MICROSCOPY OF THE ABRIKOSOV FLUX LATTICE WITH FERROMAGNETIC PROBES [J].

BERTHE, R ;

HARTMANN, U ;

HEIDEN, C .

APPLIED PHYSICS LETTERS, 1990, 57 (22) :2351-2353

[6] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[7] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[8] PREPARATION OF MAGNETIC TIPS FOR A SCANNING FORCE MICROSCOPE [J].

DENBOEF, AJ .

APPLIED PHYSICS LETTERS, 1990, 56 (20) :2045-2047

[9] PROBE CALIBRATION IN MAGNETIC FORCE MICROSCOPY [J].

GODDENHENRICH, T ;

LEMKE, H ;

MUCK, M ;

HARTMANN, U ;

HEIDEN, C .

APPLIED PHYSICS LETTERS, 1990, 57 (24) :2612-2614

[10]

GODDENHENRICH T, 1990, APPL PHYS LETT, V56, P2578, DOI 10.1063/1.102847

← 1 2 3 4 5 →