THE TETRAHEDRAL TIP AS A PROBE FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY AT 30-NM RESOLUTION

被引：43
|
作者：
FISCHER, UC
KOGLIN, J
FUCHS, H
机构：
[1] Physikalisches Institut, Westfälische Wilhelms-Universität, Münster, 48149
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1994年 / 176卷
关键词：
SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SCANNING PROBE MICROSCOPY; EVANESCENT WAVES; PHOTON SCANNING TUNNELING MICROSCOPE; OPTICAL WAVE-GUIDES;
D O I：
10.1111/j.1365-2818.1994.tb03520.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
The tetrahedral tip is introduced as a new type of a probe for scanning near-field optical microscopy (SNOM). Probe fabrication, its integration into a scheme of an inverted photon scanning tunnelling microscope and imaging at 30 nm resolution are shown. A purely optical signal is used for feedback control of the distance of the scanning tip to the sample, thus avoiding a convolution of the SNOM image with other simultaneous imaging modes such as force microscopy. The advantages of this probe seem to be a very high efficiency and its potential for SNOM at high lateral resolution below 30 nm.
引用
收藏
页码：231 / 237
页数：7
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