INFANT-MORTALITY, FREAKS, AND WEAR-OUT - APPLICATION OF MODERN SEMICONDUCTOR RELIABILITY METHODS TO CERAMIC MULTILAYER CAPACITORS

被引：20
作者：
KURTZ, SK
LEVINSON, S
SHI, DX
机构：
[1] PENN STATE UNIV, DEPT ELECT ENGN, MAT RES LAB, UNIVERSITY PK, PA 16802 USA
[2] CTR ENGN INC, STATE COLL, PA 16801 USA
来源：
JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1989年 / 72卷 / 12期
关键词：
D O I：
10.1111/j.1151-2916.1989.tb06066.x
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：2223 / 2233
页数：11
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