SUBNANOSECOND BIMOLECULAR NONRADIATIVE RECOMBINATION IN A-SI-H

被引:0
|
作者
JUSKA, G [1 ]
KOCKA, J [1 ]
VILIUNAS, M [1 ]
ARLAUSKAS, K [1 ]
机构
[1] INST PHYS, CS-16200 PRAGUE 6, CZECHOSLOVAKIA
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中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have introduced a new method of the study of fast recombination in a-Si:H, based on the measurement of the extraction time of the charge carrier reservoir generated by a short intensive light pulse. We demonstrate the advantages of the integral mode of the measurement of these photo-SCLC transients. We have found a clear transition from monomolecular to bimolecular recombination at a generation rate of about 10(18) cm(-3). The deduced coefficient of the bimolecular recombination is smaller than the same coefficient found from optical pump and probe measurements. To explain the experimental results we propose a model based on the Auger recombination of two free and one trapped charge carriers.
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页码:579 / 582
页数:4
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