A 6-PORT REFLECTOMETER AND ITS COMPLETE CHARACTERIZATION BY CONVENIENT CALIBRATION PROCEDURES

被引：57

作者：

SOMLO, PI

HUNTER, JD

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1982年 / 30卷 / 02期

关键词：

D O I：

10.1109/TMTT.1982.1131045

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：186 / 192

页数：7

相关论文

共 12 条

[1] Engen G. F., 1959, IRE T MICROWAVE THEO, P351
[2] CALIBRATING SIX-PORT REFLECTOMETER BY MEANS OF SLIDING TERMINATIONS
ENGEN, GF
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1978, 26 (12) : 951 - 957
[3] APPLICATION OF AN ARBITRARY 6-PORT JUNCTION TO POWER-MEASUREMENT PROBLEMS
ENGEN, GF
HOER, CA
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1972, IM21 (04) : 470 - &
[4] 6-PORT REFLECTOMETER - ALTERNATIVE NETWORK ANALYZER
ENGEN, GF
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1977, 25 (12) : 1075 - 1080
[5] CALIBRATION OF AN ARBITRARY 6-PORT JUNCTION FOR MEASUREMENT OF ACTIVE AND PASSIVE CIRCUIT PARAMETERS
ENGEN, GF
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1973, IM22 (04) : 295 - 299
[6] HOER CA, 1973, JUN P IMEKO S DRESD
[7] HOER CA, 1972, NBS10757 FIN REP
[8] HOER CA, 1975, NBS673 TECH NOT
[9] LOCATING REFLECTOMETER
SOMLO, PI
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (02) : 105 - &
[10] AUTOMATED MEASUREMENT OF NOISY VOLTAGES WITH A PRESET CONFIDENCE LEVEL
SOMLO, PI
[J]. ELECTRONICS LETTERS, 1977, 13 (08) : 234 - 235