X-RAY TOPOGRAPHIC STUDIES ON LATTICE DISTORTIONS OF SINGLE CRYSTALS OF SILICON DUE TO SCRATCHING

被引：13
作者：
RENNINGE.M
机构：
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1972年 / 5卷 / JUN1期
关键词：
D O I：
10.1107/S0021889872009136
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：163 / &
相关论文
共 50 条
[21]   TOPOGRAPHIC STUDIES OF AN X-RAY INTERFEROMETER OF CZOCHRALSKI-SILICON [J].
DIETRICH, B ;
KITTNER, R ;
ZAUMSEIL, P ;
GROSSWIG, S .
KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1980, 15 (08) :933-936
[22]   X-RAY TOPOGRAPHIC CHARACTERIZATION OF LATTICE STRAINS IN LEC-GROWN SINGLE CRYSTALS OF InAsP. [J].
Minato, Ichiro ;
Orito, Toshihiro ;
Sakata, Osami ;
Shishiguchi, Seiichi ;
Hashizume, Hiroo ;
Kitano, Tomohisa ;
Watanabe, Hisao ;
Kamejima, Taibun ;
Matsui, Junji .
Report of the Research Laboratory of Engineering Materials Tokyo, 1986, (11) :37-43
[23]   CROSS-SECTIONAL X-RAY TOPOGRAPHIC STUDY OF LATTICE DISTORTION IN SILICON-CRYSTALS WITH OXIDE FILM [J].
NISHINO, Y ;
ISOMAE, S ;
HORIUCHI, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1990, 29 (06) :1048-1049
[24]   X-ray studies on Bi single crystals [J].
Goetz, A ;
Hergenrother, RC .
PHYSICAL REVIEW, 1932, 40 (02) :137-150
[25]   THE X-RAY DIFFRACTION PROPERTIES OF SILICON SINGLE CRYSTALS [J].
BROGREN, G ;
LINDEN, E .
ARKIV FOR FYSIK, 1962, 22 (06) :535-541
[26]   X-RAY TOPOGRAPHIC STUDY OF DEFECTS IN SELENIUM AND TELLURIUM SINGLE CRYSTALS [J].
NAUKKARINEN, K ;
TUOMI, TO .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (07) :3054-+
[27]   INVESTIGATION OF DEFECTS IN INSB SINGLE CRYSTALS BY X-RAY TOPOGRAPHIC METHODS [J].
OLKHOVIKOVA, TI ;
SHULPINA, IL .
SOVIET PHYSICS SOLID STATE,USSR, 1969, 10 (07) :1678-+
[28]   X-RAY TOPOGRAPHIC EXAMINATION OF LARGE PARAFFIN SINGLE-CRYSTALS [J].
GREEN, RE ;
FARABAUGH, EN ;
CRISSMAN, JM .
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (03) :283-283
[29]   X-RAY TOPOGRAPHIC STUDY OF SYNTHETIC SINGLE AND TWINNED GYPSUM CRYSTALS [J].
RINAUDO, C ;
ZARKA, A .
JOURNAL OF CRYSTAL GROWTH, 1992, 116 (1-2) :87-92
[30]   X-RAY TOPOGRAPHIC INVESTIGATION OF MICRODEFORMATION OF INSB SINGLE-CRYSTALS [J].
SUROWIEC, MR ;
TANNER, BK .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1987, 55 (06) :791-805
12345