X-RAY TOPOGRAPHIC STUDIES ON LATTICE DISTORTIONS OF SINGLE CRYSTALS OF SILICON DUE TO SCRATCHING

被引：13

|

作者：

RENNINGE.M

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1972年 / 5卷 / JUN1期

关键词：

D O I：

10.1107/S0021889872009136

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：163 / &

相关论文

共 50 条

[1] X-RAY TOPOGRAPHIC STUDIES OF DISLOCATIONS IN IRON-SILICON ALLOY SINGLE CRYSTALS
LANG, AR
POLCAROVA, M
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 285 (1401) : 297 - +
[2] X-RAY TOPOGRAPHIC STUDIES OF COPPER PRECIPITATION BEHAVIOR ON DISLOCATIONS IN SILICON SINGLE-CRYSTALS
TOMIMITSU, H
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1976, 40 (02) : 505 - 512
[3] X-RAY DYNAMICAL DIFFRACTION CONTRAST DUE TO LATTICE DISTORTIONS IN KDP AND ADP CRYSTALS
FISHMAN, YM
LUTSAU, VG
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 18 (02): : 443 - 452
[4] PHOTOELASTIC AND X-RAY TOPOGRAPHIC STUDIES OF RESIDUAL-STRESS AND LATTICE DEFORMATION IN GAAS SINGLE-CRYSTALS
ADAMKIEWICZ, G
BAJOR, A
WIERZCHOWSKI, W
CRYSTAL RESEARCH AND TECHNOLOGY, 1988, 23 (07) : 901 - 909
[5] X-RAY TOPOGRAPHIC OBSERVATION OF LATTICE DEFECTS IN TGS CRYSTALS
POLCAROVA, M
JANTA, J
CZECHOSLOVAK JOURNAL OF PHYSICS, 1973, B 23 (03) : 331 - +
[6] OPTICAL AND X-RAY TOPOGRAPHIC STUDIES OF BARIUM FLUORIDE SINGLE-CRYSTALS
DESAI, CC
GEORGE, KV
CRYSTAL RESEARCH AND TECHNOLOGY, 1981, 16 (06) : 713 - 716
[7] X-ray topographic observations of minute lattice distortion near the surface of (100) silicon crystals
Fukumori, T
Futagami, K
Sakamoto, M
Hirooka, S
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (01): : 385 - 388
[8] X-RAY TOPOGRAPHIC STUDIES OF NATURAL AND DEFORMED ENSTATITE SINGLE-CRYSTALS
SCHLOESS.HH
TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1972, 53 (04): : 511 - +
[9] X-RAY TOPOGRAPHIC STUDIES OF THE POLYMERIZATION PROCESS IN PTS SINGLE-CRYSTALS
DUDLEY, M
SHERWOOD, JN
BLOOR, D
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1986, 191 : 102 - PMSE
[10] X-RAY TOPOGRAPHIC AND X-RAY MICROANALYTICAL STUDIES ON DIFFUSION OF GOLD IN SILICON
BRUMMER, O
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1971, 5 (01): : 199 - &

← 1 2 3 4 5 →