EPITAXIAL-GROWTH OF AL ON (NH4)2SX-TREATED GAAS

被引:7
|
作者
OIGAWA, H
FAN, JF
NANNICHI, Y
KAWABE, M
机构
[1] Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1990年 / 29卷 / 04期
关键词
(NH[!sub]4[!/sub])[!sub]2[!/sub]S[!sub]x[!/sub]-treatment; AES; Epitaxial growth; GaAs; RHEED; Schottky contact;
D O I
10.1143/JJAP.29.L544
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial growth of Al film on the (NH4)2Sx-treated surface of (100) GaAs was investigated by means of reflection high-energy electron diffraction (RHEED). A single crystal of epitaxial (110) Al film was obtained on the treated surface with heat treatment at 300°C prior to Al deposition, while Al film became polycrystalline without heat treatment. The effect is explained in terms of the alignment of S atoms on GaAs. The (NH4)2Sx-treated surface seems to be useful in the wide range of GaAs processes. © 1990 IOP Publishing Ltd.
引用
收藏
页码:L544 / L547
页数:4
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