EFFECTIVE DEEP ULTRAVIOLET PHOTOETCHING OF POLY(METHYL METHACRYLATE BY AN EXCIMER LASER

被引:269
作者
KAWAMURA, Y
TOYODA, K
NAMBA, S
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D O I
10.1063/1.93108
中图分类号
O59 [应用物理学];
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页码:374 / 375
页数:2
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[1]  
AOYAGI A, 1979, OPTICS COMMUN, V29, P253
[2]   VACUUM ULTRAVIOLET HOLOGRAPHY [J].
BJORKLUND, GC ;
HARRIS, SE ;
YOUNG, JF .
APPLIED PHYSICS LETTERS, 1974, 25 (08) :451-452
[3]   NEW HIGH-RESOLUTION CHARGE-TRANSFER X-RAY AND ELECTRON-BEAM NEGATIVE RESIST [J].
HOFER, DC ;
KAUFMAN, FB ;
KRAMER, SR ;
AVIRAM, A .
APPLIED PHYSICS LETTERS, 1980, 37 (03) :314-316
[4]   DEEP UV LITHOGRAPHY [J].
LIN, BJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1317-1320
[5]   100 MW, 248.4 NM, KRF LASER-EXCITED BY AN ELECTRON-BEAM [J].
TISONE, GC ;
HAYS, AK ;
HOFFMAN, JM .
OPTICS COMMUNICATIONS, 1975, 15 (02) :188-189
[6]   TEMPORARY GRATINGS ON GERMANIUM [J].
WIGGINS, TA ;
SALIK, A .
APPLIED PHYSICS LETTERS, 1974, 25 (08) :438-440