QUANTITATIVE TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS WITH MONOENERGETIC EXCITATION

被引：11
作者：
LADISICH, W
RIEDER, R
WOBRAUSCHEK, P
机构：
[1] Atominstitut Der Österreichischen Universitäten, Vienna, A-1020
来源：
X-RAY SPECTROMETRY | 1994年 / 23卷 / 04期
关键词：
D O I：
10.1002/xrs.1300230407
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
By applying monoenergetic excitation in total reflection x-ray fluorescence analysis, the quantitative analysis can be further simplified since fundamental parameters from tables can be used for the calculation of elemental sensitivities. Establishing calibration graphs experimentally by measuring multielement standards is no longer necessary. Advantages of monoenergetic excitation are discussed.
引用
收藏
页码：173 / 177
页数：5
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