SOME INVESTIGATIONS OF THE HETEROJUNCTIONS IN AIVBIV SYSTEMS

被引：14

作者：

DJUNEVA, KD

PENEVA, SK

TSUKEVA, EA

BATOV, I

机构：

来源：

THIN SOLID FILMS | 1980年 / 67卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90472-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：371 / 383

页数：13

共 16 条

[1] STUDY OF TIN DIFFUSION INTO SILICON BY BACKSCATTERING ANALYSIS [J].

AKASAKA, Y ;

HORIE, K ;

NAKAMURA, G ;

TSUKAMOTO, K ;

YUKIMOTO, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (10) :1533-1540

[2]

BAVERSTAM U, 1974, MOSSBAUER EFFECT MET, V9, P259

[3]

BONCHEV T, 1977, DOKL BOLG AKAD NAUK, V30, P1271

[4]

BONCHEV T, 1977, Patent No. 35797

[5]

BONCHEV T, 1978, Patent No. 25615

[6] EMPIRICAL-METHOD OF QUANTITATIVE-ANALYSIS IN DEPTH-SELECTIVE ME-SPECTROSCOPY [J].

BONCHEV, TSV ;

MINKOVA, A ;

KUSHEV, G ;

GROZDANOV, M .

NUCLEAR INSTRUMENTS & METHODS, 1977, 147 (03) :481-486

[7] METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT [J].

BONCHEV, Z ;

JORDANOV, A ;

MINKOVA, A .

NUCLEAR INSTRUMENTS & METHODS, 1969, 70 (01) :36-&

[8]

ELLIOT RP, CONSTITUTION BINARY, V2, P317

[9]

MINKOVA A, THESIS

[10]

NISTIRIUK IV, 1975, SOV PHYS SOLID STATE, V17, P1192

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