EVALUATION OF RECENT SI(111)-(7X7)SURFACE MODELS

被引：0

作者：

MILLER, DJ

HANEMAN, D

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来源：

SURFACE SCIENCE | 1981年 / 104卷 / 2-3期

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中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

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页码：L237 / L244

页数：8

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[1] ATOMIC AND ELECTRONIC-STRUCTURE OF THE 7X7 RECONSTRUCTED SI(111) SURFACE
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[2] ENERGY-MINIMIZATION APPROACH TO ATOMIC GEOMETRY OF SEMICONDUCTOR SURFACES
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[3] DETERMINATION OF STRUCTURE OF ADSORBED MONOLAYERS BY ENERGY-AVERAGING METHOD - A1(100)
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[J]. SURFACE SCIENCE, 1972, 30 (03) : 659 - &
[4] LOW-ENERGY ELECTRON-DIFFRACTION FROM SI(111)-2 X 1 - THEORY AND EXPERIMENT
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AUER, PP
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (05): : L179 - L184
[5] A NEW STRUCTURE MODEL FOR THE SI(111) 7X7 SURFACE-STRUCTURE
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (02) : L61 - L64
[6] SI (111) 7X7 SURFACE-STRUCTURE - CALCULATIONS OF LEED INTENSITY AND COMPARISON WITH EXPERIMENT
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MARK, P
[J]. PHYSICAL REVIEW B, 1977, 16 (12): : 5415 - 5425
[7] LEED ANALYSIS AND ENERGY MINIMIZATION CALCULATIONS FOR SI(111) (7BY7) SURFACE-STRUCTURES
MILLER, DJ
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1270 - 1285
[8] LEED ANALYSIS OF SI(111)-(7X7) SURFACE MODELS
MILLER, DJ
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WALKER, LW
[J]. SURFACE SCIENCE, 1980, 94 (2-3) : 555 - 563
[9] DETERMINATION OF SURFACE STRUCTURES FROM LOW ENERGY ELECTRON DIFFRACTION MEASUREMENTS
TUCKER, CW
DUKE, CB
[J]. SURFACE SCIENCE, 1970, 23 (02) : 411 - &