共 50 条
- [41] INVESTIGATION OF LAYERED SOLID-STATE STRUCTURES BY THE PHOTOTHERMAL DEFLECTION METHOD SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1989, 25 (09): : 646 - 651
- [42] Investigation of the impurity distribution in layered semiconductor structures by means of IR non-destructive diagnostics NEW APPROACHES TO HIGH-TECH MATERIALS: NONDESTRUCTIVE TESTING AND COMPUTER SIMULATIONS IN MATERIALS SCIENCE AND ENGINEERING, 1998, 3345 : 55 - 60
- [43] Structural and electronic investigation of metal-semiconductor hybrid tetrapod hetero-structures GOLD BULLETIN, 2017, 50 (02): : 105 - 110
- [44] Structural and electronic investigation of metal-semiconductor hybrid tetrapod hetero-structures Gold Bulletin, 2017, 50 : 105 - 110
- [48] 1ST-PRINCIPLES METHOD FOR CALCULATING ELECTRONIC-PROPERTIES OF LAYERED STRUCTURES PHYSICAL REVIEW B, 1989, 40 (06): : 3638 - 3642