NEAR-FIELD SCANNING OPTICAL MICROSCOPY-II

被引：25

作者：

ISAACSON, M

CLINE, JA

BARSHATZKY, H

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 06期

关键词：

D O I：

10.1116/1.585320

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A brief survey of the principles of near-field optical imaging will be presented. Selected examples of super resolution imaging using visible reflected light will demonstrate that lateral resolution far smaller than the illumination wavelength can be achieved and that the technique is surface sensitive. In addition, we will demonstrate that subwavelength resolution can be achieved in the near-infrared spectral regime and that near-field scanning optical microscopy (NSOM) can be used in diagnostic inspection of hetrojunction laser modal emission patterns.

引用

页码：3103 / 3107

页数：5

共 21 条

[1] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].

ASH, EA ;

NICHOLLS, G .

NATURE, 1972, 237 (5357) :510-&

[2] BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].

BETZIG, E ;

TRAUTMAN, JK ;

HARRIS, TD ;

WEINER, JS ;

KOSTELAK, RL .

SCIENCE, 1991, 251 (5000) :1468-1470

[3] NEAR-FIELD DIFFRACTION BY A SLIT - IMPLICATIONS FOR SUPERRESOLUTION MICROSCOPY [J].

BETZIG, E ;

HAROOTUNIAN, A ;

LEWIS, A ;

ISAACSON, M .

APPLIED OPTICS, 1986, 25 (12) :1890-1900

[4]

BETZIG E, 1988, P SOC PHOTO-OPT INS, V987, P91

[5]

Brown KT, 1986, ADV MICROPIPETTE TEC

[6]

CLINE JA, IN PRESS ULTRAMICROS

[7] EXTERNAL AND INTERNAL-REFLECTION NEAR-FIELD MICROSCOPY - EXPERIMENTS AND RESULTS [J].

COURJON, D ;

VIGOUREUX, JM ;

SPAJER, M ;

SARAYEDDINE, K ;

LEBLANC, S .

APPLIED OPTICS, 1990, 29 (26) :3734-3740

[8] NEAR-FIELD OPTICAL-SCANNING MICROSCOPY IN REFLECTION [J].

FISCHER, UC ;

DURIG, UT ;

POHL, DW .

APPLIED PHYSICS LETTERS, 1988, 52 (04) :249-251

[9]

HAROOTUNIAN A, 1987, THESIS CORNELL U

[10]

ISAACSON M, IN PRESS S SCANNED P

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