SWITCH FROM THIN TO BULK BEHAVIOR OF TYPE 2 SUPERCONDUCTING FILMS

被引：1

作者：

BROWN, RW

机构：

[1] U.S. Naval Ordnance Laboratory, Silver Spring, MD

来源：

PHYSICS LETTERS A | 1969年 / A 28卷 / 09期

关键词：

D O I：

10.1016/0375-9601(69)90497-6

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Measurements are reported of the upper critical field for disordered and annealed superconducting tin films. For each film, the switch from thin to bulk behavior is found at a field value independent of state of anneal. © 1989.

引用

页码：663 / &

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