NEAR-SURFACE ELECTRONIC-STRUCTURE IN GAAS (100) MODIFIED WITH SELF-ASSEMBLED MONOLAYERS OF OCTADECYLTHIOL

被引:50
作者
DORSTEN, JF
MASLAR, JE
BOHN, PW
机构
[1] UNIV ILLINOIS, DEPT CHEM, URBANA, IL 61801 USA
[2] UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
关键词
D O I
10.1063/1.113357
中图分类号
O59 [应用物理学];
学科分类号
摘要
Passivation of the GaAs (100) surface by self-assembled monolayers of octadecylthiol (ODT) has been studied using inelastic light scattering as a probe of the near-surface electronic structure. Application of the ODT self-assembled monolayers reduces the width of the depletion region at the surface of GaAs resulting in a reduction of the surface band bending, and the electron scattering time is increased as well. The ODT passivated surfaces are more stable to environmental degradation, over time and under temperature stress, than inorganic sulfide treated surfaces which have been reported. Organic thiol passivation may provide an attractive alternative to inorganic sulfide protocols for reduction of surface recombination velocities in III-V devices.© 1995 American Institute of Physics.
引用
收藏
页码:1755 / 1757
页数:3
相关论文
共 25 条
[1]   SULFIDE PASSIVATION OF GAAS - STUDY OF SURFACE BAND BENDING [J].
BERKOVITS, VL ;
BESSOLOV, VN ;
LVOVA, TV ;
MAKARENKO, IV ;
SAFAROV, VI ;
TSARENKOV, BV .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1991, 9 (1-3) :43-46
[2]   EFFECT OF SODIUM SULFIDE TREATMENT ON BAND BENDING IN GAAS [J].
BESSER, RS ;
HELMS, CR .
APPLIED PHYSICS LETTERS, 1988, 52 (20) :1707-1709
[3]   SCHOTTKY-BARRIER FORMATION ON (NH4)2S-TREATED N-TYPE AND P-TYPE (100)GAAS [J].
CARPENTER, MS ;
MELLOCH, MR ;
DUNGAN, TE .
APPLIED PHYSICS LETTERS, 1988, 53 (01) :66-68
[4]   PASSIVATION OF GAAS(001) SURFACES BY INCORPORATION OF GROUP-VI ATOMS - A STRUCTURAL INVESTIGATION [J].
CHAMBERS, SA ;
SUNDARAM, VS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04) :2256-2262
[5]   P2S5 PASSIVATION OF GAAS-SURFACES FOR SCANNING TUNNELING MICROSCOPY IN AIR [J].
DAGATA, JA ;
TSENG, W ;
BENNETT, J ;
SCHNEIR, J ;
HARARY, HH .
APPLIED PHYSICS LETTERS, 1991, 59 (25) :3288-3290
[6]   RAMAN-SCATTERING MEASUREMENTS OF DECREASED BARRIER HEIGHTS IN GAAS FOLLOWING SURFACE CHEMICAL PASSIVATION [J].
FARROW, LA ;
SANDROFF, CJ ;
TAMARGO, MC .
APPLIED PHYSICS LETTERS, 1987, 51 (23) :1931-1933
[7]   H2S-TREATED GAP(001) SURFACE STUDIED BY LOW-ENERGY ELECTRON-DIFFRACTION, AUGER-ELECTRON SPECTROSCOPY, AND X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
FUKUDA, Y ;
SANADA, N ;
KURODA, M ;
SUZUKI, Y .
APPLIED PHYSICS LETTERS, 1992, 61 (08) :955-957
[8]   DETERMINATION OF THE CHARGE CARRIER CONCENTRATION ACROSS GROWTH STRIATIONS IN N-GAAS BY RAMAN-SPECTROSCOPY [J].
HERMS, M ;
IRMER, G ;
MONECKE, J ;
OETTEL, O .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (01) :432-435
[9]  
KLEIN MV, 1983, LIGHT SCATTERING SOL, V1, P157
[10]   PASSIVATION OF GAAS (100) USING SELENIUM SULFIDE [J].
KURUVILLA, BA ;
GHAISAS, SV ;
DATTA, A ;
BANERJEE, S ;
KULKARNI, SK .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (09) :4384-4387