SPECIMEN THICKNESS AND IMAGE RESOLUTION IN ELECTRON MICROSCOPY

被引：29
作者：
COSSLETT, VE
机构：
来源：
BRITISH JOURNAL OF APPLIED PHYSICS | 1956年 / 7卷 / 01期
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D O I：
10.1088/0508-3443/7/1/303
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：10 / 13
页数：4
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