AN XPS ARGUMENT AGAINST THE USE OF ELECTRON EXCITED SPECTROSCOPIES IN STUDIES OF THE ELECTRONIC-STRUCTURE OF VANADIUM PENTOXIDE

被引:0
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作者
SUONINEN, E [1 ]
MINNI, E [1 ]
CURELARU, IM [1 ]
机构
[1] CHALMERS UNIV TECHNOL,DEPT PHYS,S-41296 GOTEBORG,SWEDEN
来源
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1981年 / 6卷 / 01期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1 / 8
页数:8
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