QUANTITATIVE EFFECTS OF INTERFACE STATES ON PERFORMANCE OF CHARGE-COUPLED DEVICES

被引:75
作者
TOMPSETT, MF [1 ]
机构
[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
关键词
D O I
10.1109/T-ED.1973.17607
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:45 / 55
页数:11
相关论文
共 20 条
[1]   CHARGE-COUPLED IMAGING DEVICES - DESIGN CONSIDERATIONS [J].
AMELIO, GF ;
BERTRAM, WJ ;
TOMPSETT, MF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1971, ED18 (11) :986-+
[2]   COMPUTER MODELING OF CHARGE-COUPLED DEVICE CHARACTERISTICS [J].
AMELIO, GF .
BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (03) :705-+
[3]   PERFORMANCE LIMITATIONS OF IGFET BUCKET-BRIGADE SHIFT REGISTER [J].
BERGLUND, CN ;
BOLL, HJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (07) :852-+
[5]   CHARGE COUPLED SEMICONDUCTOR DEVICES [J].
BOYLE, WS ;
SMITH, GE .
BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04) :587-+
[6]   INTERFACE STATES IN SI-SIO2 INTERFACES [J].
DEULING, H ;
KLAUSMANN, E ;
GOETZBERGER, A .
SOLID-STATE ELECTRONICS, 1972, 15 (05) :559-+
[7]   ELECTRON-HOLE RECOMBINATION IN GERMANIUM [J].
HALL, RN .
PHYSICAL REVIEW, 1952, 87 (02) :387-387
[8]   LINEARIZED DISPERSION RELATION AND GREENS FUNCTION FOR DISCRETE-CHARGE-TRANSFER DEVICES WITH INCOMPLETE TRANSFER [J].
JOYCE, WB ;
BERTRAM, WJ .
BELL SYSTEM TECHNICAL JOURNAL, 1971, 50 (06) :1741-+
[9]  
SEQUIN CH, UNPUBLISHED
[10]   STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS [J].
SHOCKLEY, W ;
READ, WT .
PHYSICAL REVIEW, 1952, 87 (05) :835-842