共 50 条
- [1] SPECIAL FEATURES OF X-RAY DETERMINATION OF THERMAL INTERPHASE MICROSTRESSES INDUSTRIAL LABORATORY, 1971, 37 (09): : 1396 - &
- [2] X-RAY DETERMINATION OF MICROSTRESSES IN QUENCHED AND LOW-ANNEALED STEEL INDUSTRIAL LABORATORY, 1976, 42 (08): : 1289 - 1290
- [3] QUANTITATIVE DETERMINATION OF CARBIDES IN MIXTURES BY MEANS OF AN X-RAY METHOD INDUSTRIAL LABORATORY, 1971, 37 (09): : 1425 - +
- [4] X-ray study of microstresses in lamellar pearlite ICOTOM 14: TEXTURES OF MATERIALS, PTS 1AND 2, 2005, 495-497 : 1511 - 1516
- [5] X-ray orientation determination of single crystals by means of the Ω-Scan Method JOURNAL DE PHYSIQUE IV, 2004, 118 : 37 - 42
- [8] DETERMINATION OF X-RAY THERMAL DIFFUSE SCATTERING IN SILICON AND ZINC BY MEANS OF MOSSBAUER EFFECT BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1968, 13 (03): : 490 - &
- [9] The quantitative determination of tantalum by x-ray spectrographic means ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1927, 164 (1/3): : 69 - 80