A NON-DESTRUCTIVE X-RAY METHOD FOR THE DETERMINATION OF THE THICKNESS OF SURFACE LAYERS

被引：9
|
作者：
GAY, P
HIRSCH, PB
机构：
来源：
BRITISH JOURNAL OF APPLIED PHYSICS | 1951年 / 2卷 / AUG期
关键词：
D O I：
10.1088/0508-3443/2/8/302
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：218 / 222
页数：5
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