SCANNING TUNNELING MICROSCOPY

被引：0
|
作者：
NISHIKAWA, O [1 ]
机构：
[1] TOKYO INST TECHNOL,GRAD SCH NAGATSUTA,DEPT MAT SCI ENGN,YOKOHAMA,KANAGAWA 227,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1988年 / 37卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：92 / 93
页数：2
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