THE IMGC VOLUME-DENSITY STANDARDS FOR THE AVOGADRO CONSTANT

被引:13
作者
SACCONI, A
PEUTO, AM
MOSCA, M
PANCIERA, R
PASIN, W
PETTORRUSO, S
机构
[1] Istituto di Metrologia G. Colonnetti (IMGC), I-10135 Torino
关键词
D O I
10.1109/19.377900
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Volume-density standards in the form of single-crystal silicon spheres have been introduced and developed at the IMGC. A new sphere of nearly perfect form has been characterized on the basis of a comprehensive set of interferometric, roundness, mass and hydrostatic measurements. From its mass and volume and from the evaluation of the oxide layer and of impurities, a density of (2.32908350 +/- 0.00000036) g/cm(3) has been assigned to a near-perfect silicon crystal. In comparison to the measurements based on a previous sphere, the relative combined uncertainty has been reduced from 4.1 x 10(-7) to 1.5 x 10(-7).
引用
收藏
页码:533 / 537
页数:5
相关论文
共 15 条
[1]   A NEW DETERMINATION OF N-A [J].
BASILE, G ;
BECKER, P ;
BERGAMIN, A ;
BETTIN, H ;
CAVAGNERO, G ;
DEBIEVRE, P ;
KUTGENS, U ;
MANA, G ;
MOSCA, M ;
PAJOT, B ;
PANCIERA, R ;
PASIN, W ;
PETTORRUSO, S ;
PEUTO, A ;
SACCONI, A ;
STUMPEL, J ;
VALKIERS, S ;
VITTONE, E ;
ZOSI, G .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (02) :538-541
[2]   AN UPDATED EDLEN EQUATION FOR THE REFRACTIVE-INDEX OF AIR [J].
BIRCH, KP ;
DOWNS, MJ .
METROLOGIA, 1993, 30 (03) :155-162
[3]  
BIRELLO G, 1991, 12TH P IMEKO WORLD C, P344
[4]   EQUATION FOR THE DETERMINATION OF THE DENSITY OF MOIST AIR (1981/91) [J].
DAVIS, RS .
METROLOGIA, 1992, 29 (01) :67-70
[5]   DETERMINATION OF DIFFERENCES IN THE DENSITY OF SILICON SINGLE-CRYSTALS BY OBSERVING THEIR FLOTATION AT DIFFERENT PRESSURES [J].
KOZDON, AF ;
SPIEWECK, F .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (03) :420-426
[6]  
LEISTNER A, 1991, METROLOGIA, V28, P503
[7]  
MOSCA M, 1994, 13 P IMEKO WORLD C T, P2303
[8]  
MOSCA M, 1993, 13TH P C FORC MASS M, P200
[9]   COMPARISON OF SILICON DENSITY STANDARDS AT NRLM AND IMGC [J].
PEUTO, AM ;
SACCONI, A ;
MOSCA, M ;
FUJII, KI ;
TANAKA, M ;
NEZU, Y .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1993, 42 (02) :242-246
[10]  
PUETO A, 1991, IEEE T INSTRUM MEAS, V40, P103