ANALYTICAL RELATIONS FOR THIN-FILM EXTERNAL-REFLECTION PHASE RETARDERS

被引：0
|
作者：
COJOCARU, E
机构：
来源：
OPTICA APPLICATA | 1993年 / 23卷 / 04期
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暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Thin-film coated external reflection phase retarders at given angle of incidence and specific phase retardation are analytically approached for a two-reflection system with two, one coated and the other uncoated, mirrors. Single-layer and specific symmetrical triple-layer dielectric coatings on absorbing substrates are considered. Useful diagrams of solution zones for refractive indices are obtained. Simple relations for one-reflection systems in the case of non-absorbing substrates are also infereed.
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页码：267 / 273
页数：7
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