ANALYTICAL RELATIONS FOR THIN-FILM EXTERNAL-REFLECTION PHASE RETARDERS

Thin-film coated external reflection phase retarders at given angle of incidence and specific phase retardation are analytically approached for a two-reflection system with two, one coated and the other uncoated, mirrors. Single-layer and specific symmetrical triple-layer dielectric coatings on absorbing substrates are considered. Useful diagrams of solution zones for refractive indices are obtained. Simple relations for one-reflection systems in the case of non-absorbing substrates are also infereed.