ON MAGNETIC CONTRAST IN MIRROR ELECTRON-MICROSCOPY

被引：0
作者：
KACHNIARZ, J
ZAREMBINSKI, S
机构：
来源：
OPTIK | 1980年 / 57卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：287 / 290
页数：4
相关论文
共 50 条
[31]   PHASE-CONTRAST ELECTRON-MICROSCOPY AND POLYMER MICROSTRUCTURE [J].
ROCHE, EJ ;
THOMAS, EL .
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1980, 25 (03) :251-251
[32]   INFLUENCE OF DIFFUSION ON CHANGE OF CONTRAST IN SECTIONS FOR ELECTRON-MICROSCOPY [J].
LIPPERT, W .
ZEITSCHRIFT FUR NATURFORSCHUNG C-A JOURNAL OF BIOSCIENCES, 1973, C 28 (7-8) :413-416
[33]   DEFOCUSING PHASE-CONTRAST EFFECTS IN ELECTRON-MICROSCOPY [J].
JOHNSON, DJ ;
CRAWFORD, D .
JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG) :313-324
[34]   DIFFRACTION CONTRAST IN SCANNING ELECTRON-MICROSCOPY - PRINCIPLES AND APPLICATIONS [J].
VICARIO, E ;
PITAVAL, M .
JOURNAL DE MICROSCOPIE, 1972, 13 (03) :296-+
[35]   POLARIZATION CONTRAST OF CATHODOLUMINESCENCE, OBSERVED IN SCANNING ELECTRON-MICROSCOPY [J].
SPIVAK, GV ;
FILIPPOV, MN ;
ANTOSHIN, MK .
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1977, 41 (05) :876-879
[36]   CONTRAST FORMATION IN ELECTRON-MICROSCOPY OF BIOLOGICAL-MATERIAL [J].
CARLEMALM, E ;
COLLIEX, C ;
KELLENBERGER, E .
ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS, 1985, 63 :269-334
[37]   ELECTRON MIRROR MICROSCOPY IN MEASURING MAGNETIC FIELDS [J].
RAU, EI ;
LUKYANOV, AE ;
SPIVAK, GV ;
GVOZDOVE.RS .
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1970, 34 (07) :1539-&
[38]   LASER-INDUCED DESORPTION STUDIED WITH MIRROR ELECTRON-MICROSCOPY [J].
GAUTHIER, R ;
BABOUT, M ;
GUITTARD, C .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1978, 48 (02) :459-464
[39]   DISAPPEARANCE OF TOPOGRAPHICAL CONTRAST IN THE BACKSCATTERED ELECTRON IMAGE IN SCANNING ELECTRON-MICROSCOPY [J].
IKUTA, T .
APPLIED PHYSICS LETTERS, 1983, 42 (06) :533-534
[40]   TRANSMISSION ELECTRON-MICROSCOPY OBSERVATIONS OF MAGNETIC MULTILAYERS [J].
MODAK, AR ;
PARKIN, SSP ;
SMITH, DJ .
ULTRAMICROSCOPY, 1992, 47 (04) :375-382
12345