EFFECT OF SI3N4 ENCAPSULATION ON THE LASER-ANNEALING BEHAVIOR OF GAAS

被引:8
作者
BADAWI, MH
AKINTUNDE, JA
SEALY, BJ
STEPHENS, KG
机构
[1] Department of Electronic and Electrical Engineering, University of Surrey, Guildford, Surrey
关键词
Annealing; Encapsulation; Gallium arsenide; III-V semiconductors; Laser beam applications;
D O I
10.1049/el:19790321
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
When semi-insulating GaAs samples are coated with pyrolytically deposited Si3N4 layers and subsequently irradiated with a Q-switched ruby laser with energy densities > 0·3 J/cm2, it is found that a thin layer (0·1–0·25 µm) of the underlying GaAs substrates becomes n-type. This phenomenon may be the reason why, in previous work on laser annealing of donor implanted GaAs samples, the percentage electrical activity increased when samples were coated with Si3N4. © 1979, The Institution of Electrical Engineers. All rights reserved.
引用
收藏
页码:447 / 448
页数:2
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