COPPER PALLADIUM ALLOY SURFACES .1. CU/PD[85-15](110), SURFACE-STRUCTURE AND REACTIVITY

被引:61
作者
NEWTON, MA [1 ]
FRANCIS, SM [1 ]
LI, YX [1 ]
LAW, D [1 ]
BOWKER, M [1 ]
机构
[1] UNIV LIVERPOOL,DEPT CHEM,LEVERHULME CTR INNOVAT CATALYSIS,LIVERPOOL L69 3BX,ENGLAND
关键词
D O I
10.1016/0039-6028(91)90522-T
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Both ordered and disordered phases of Cu:Pd[85:15]{110} have been studied using low-energy electron diffraction (LEED), X-ray photoelectron spectroscopy (XPS), and ultraviolet photoelectron spectroscopy (UPS). Low-energy ion scattering (LEIS) has also been employed to study the ordered surface. In the case of the ordered phase, these techniques have been used to ascertain the structural and electronic influence of the Pd on this surface in comparison to that observed for Cu(110). In addition temperature-programmed desorption (TPD) has been employed to determine the chemical reactivity of this surface towards the decomposition of adsorbed formic acid (HCOOH) and C-deuterated formic acid (DCOOH).This is compared to the same reaction on Cu(110) and a kinetic isotope effect is noted in the decomposition of the two acids. Segregation of the Cu component of the alloy is observed upon the thermally induced transition from disordered to ordered surface phases, leaving the surface layer essentially free of Pd, while the second layer is enriched in Pd to approximately 50% composition.
引用
收藏
页码:45 / 55
页数:11
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共 31 条
  • [21] ELECTRONIC-STRUCTURE OF COPPER-RICH COPPER-PALLADIUM ALLOYS
    RAO, RS
    BANSIL, A
    ASONEN, H
    PESSA, M
    [J]. PHYSICAL REVIEW B, 1984, 29 (04): : 1713 - 1721
  • [22] RELATIVE INTENSITIES IN PHOTOELECTRON-SPECTROSCOPY OF ATOMS AND MOLECULES
    REILMAN, RF
    MSEZANE, A
    MANSON, ST
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (05) : 389 - 394
  • [23] SCHOFIELD JH, 1976, J ELECTRON SPECTROSC, V8, P129
  • [24] PURE ELEMENT SPUTTERING YIELDS USING 500-1000 EV ARGON IONS
    SEAH, MP
    [J]. THIN SOLID FILMS, 1981, 81 (03) : 279 - 287
  • [25] SMOLUCHOWSKI, 1967, HDB PHYSICS, P8
  • [26] SURFACE ANALYSIS WITH LOW-ENERGY ION SCATTERING
    TAGLAUER, E
    HEILAND, W
    [J]. APPLIED PHYSICS, 1976, 9 (04): : 261 - 275
  • [27] REGULARIZATION - A STABLE AND ACCURATE METHOD FOR GENERATING DEPTH PROFILES FROM ANGLE-DEPENDENT XPS DATA
    TYLER, BJ
    CASTNER, DG
    RATNER, BD
    [J]. SURFACE AND INTERFACE ANALYSIS, 1989, 14 (08) : 443 - 450
  • [28] LOCAL LATTICE EXPANSION AROUND PD IMPURITIES IN CU AND ITS INFLUENCE ON THE PD DENSITY OF STATES - AN EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND AUGER STUDY
    WEIGHTMAN, P
    WRIGHT, H
    WADDINGTON, SD
    VANDERMAREL, D
    SAWATZKY, GA
    DIAKUN, GP
    NORMAN, D
    [J]. PHYSICAL REVIEW B, 1987, 36 (17): : 9098 - 9106
  • [29] EXPERIMENTAL-DETERMINATION OF THE PD AND CU DENSITIES OF STATES IN CU75PD25
    WRIGHT, H
    WEIGHTMAN, P
    ANDREWS, PT
    FOLKERTS, W
    FLIPSE, CFJ
    SAWATZKY, GA
    NORMAN, D
    PADMORE, H
    [J]. PHYSICAL REVIEW B, 1987, 35 (02): : 519 - 523
  • [30] SURFACE-STRUCTURE DETERMINATION WITH FORWARD FOCUSED ELECTRONS
    XU, ML
    VANHOVE, MA
    [J]. SURFACE SCIENCE, 1989, 207 (2-3) : 215 - 232