CHEMICAL MEASUREMENTS OF RADIATION-DAMAGE IN ORGANIC-SAMPLES AT AND BELOW ROOM-TEMPERATURE

被引：47
作者：
EGERTON, RF
机构：
来源：
ULTRAMICROSCOPY | 1980年 / 5卷 / 04期
关键词：
D O I：
10.1016/0304-3991(80)90051-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：521 / 523
页数：3
相关论文
共 14 条
[1]  
CRANK J, 1968, DIFFUSION POLYM, P46
[2]   SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1978, 3 (01) :39-47
[3]   K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1979, 4 (02) :169-179
[4]  
EGERTON RF, 1980, J MICROSC-OXFORD, V118, P389, DOI 10.1111/j.1365-2818.1980.tb00288.x
[5]  
EGERTON RF, 1980, DEV ELECTRON MICROSC, P323
[6]   RADIATION-DAMAGE IN STAINED CATALASE AT LOW-TEMPERATURE [J].
GLAESER, RM ;
HOBBS, LW .
JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :209-214
[7]   RADIATION-DAMAGE RELATIVE TO TRANSMISSION ELECTRON-MICROSCOPY OF BIOLOGICAL SPECIMENS AT LOW-TEMPERATURE - REVIEW [J].
GLAESER, RM ;
TAYLOR, KA .
JOURNAL OF MICROSCOPY, 1978, 112 (JAN) :127-138
[8]  
GLAESER RM, 1971, J MICROSC-PARIS, V12, P133
[9]   RADIATION-DAMAGE OF PURPLE MEMBRANE AT LOW-TEMPERATURE [J].
HAYWARD, SB ;
GLAESER, RM .
ULTRAMICROSCOPY, 1979, 4 (02) :201-210
[10]   ELECTRON-BEAM INDUCED DAMAGE OF ORGANIC-SOLIDS - IMPLICATIONS FOR ANALYTICAL ELECTRON-MICROSCOPY [J].
ISAACSON, M .
ULTRAMICROSCOPY, 1979, 4 (02) :193-199
12