ENERGY-SPECTRUM MEASUREMENT OF SECONDARY ELECTRONS SPUTTERED BY ATOMS AND IONS WITH AN MI 1201E MASS-SPECTROMETER

被引：0
|
作者：
PRONCHEV, GB
TANTSYREV, GD
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1992年 / 35卷 / 04期
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A small energy analyzer is described. The analyzer is mounted on a MI 1201E mass spectrometer instead of the ion source and allows the atom-electron and ion-electron emission from various substances to be investigated. The analyzer resolution is approximately 100.
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页码：653 / 655
页数：3
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