THERMAL MELTING OF ARACHIDIC ACID MONOLAYERS IN ULTRATHIN MULTILAYERS - A HIGH-RESOLUTION X-RAY-DIFFRACTION STUDY

被引：24
|
作者：
RICHARDSON, W [1 ]
BLASIE, JK [1 ]
机构：
[1] UNIV PENN,RES STRUCT MATTER LAB,PHILADELPHIA,PA 19104
来源：
PHYSICAL REVIEW B | 1989年 / 39卷 / 16期
关键词：
D O I：
10.1103/PhysRevB.39.12165
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：12165 / 12181
页数：17
相关论文
共 50 条
  • [1] HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF MULTILAYERS
    CHRISTENSEN, FE
    HORNSTRUP, A
    SCHNOPPER, HW
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1988, 21 : 252 - 257
  • [2] HIGH-RESOLUTION X-RAY-DIFFRACTION OF PHOTORECEPTOR MULTILAYERS
    GRUNER, SM
    ROTHSCHILD, KJ
    CLARK, NA
    BIOPHYSICAL JOURNAL, 1982, 37 (02) : A142 - A142
  • [3] PRECISE DETERMINATION OF TILT ANGLES BY X-RAY-DIFFRACTION AND REFLECTION WITH ARACHIDIC ACID MONOLAYERS
    TIPPMANNKRAYER, P
    MOHWALD, H
    LANGMUIR, 1991, 7 (10) : 2303 - 2306
  • [4] SLITS AND HIGH-RESOLUTION X-RAY-DIFFRACTION
    VANDERSLUIS, P
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 : 1015 - 1019
  • [5] A HIGH-RESOLUTION X-RAY-DIFFRACTION STUDY IN INGAAS/INP SUPERLATTICES
    FRANCESIO, L
    FRANZOSI, P
    LANDGREN, G
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (4A) : A169 - A171
  • [6] STRUCTURAL STUDY OF THE ANNEALING OF ALKYLSILOXANE SELF-ASSEMBLED MONOLAYERS ON SILICON BY HIGH-RESOLUTION X-RAY-DIFFRACTION
    MURPHY, MA
    NORDGREN, CE
    FISCHETTI, RF
    BLASIE, JK
    PETICOLAS, LJ
    BEAN, JC
    JOURNAL OF PHYSICAL CHEMISTRY, 1995, 99 (38): : 14039 - 14051
  • [7] SYNCHROTRON X-RAY-DIFFRACTION AND REFLECTION STUDIES OF ARACHIDIC ACID MONOLAYERS AT THE AIR-WATER-INTERFACE
    KJAER, K
    ALSNIELSEN, J
    HELM, CA
    TIPPMANKRAYER, P
    MOHWALD, H
    JOURNAL OF PHYSICAL CHEMISTRY, 1989, 93 (08): : 3200 - 3206
  • [8] CHARACTERIZATION OF MULTILAYER SYSTEMS BY HIGH-RESOLUTION X-RAY-DIFFRACTION
    APPEL, A
    BONSE, U
    STAUDENMANN, JL
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1990, 81 (03): : 371 - 379
  • [9] HIGH-RESOLUTION X-RAY-DIFFRACTION AND TOPOGRAPHY FOR CRYSTAL CHARACTERIZATION
    TANNER, BK
    JOURNAL OF CRYSTAL GROWTH, 1990, 99 (1-4) : 1315 - 1323
  • [10] HIGH-RESOLUTION X-RAY-DIFFRACTION OF PERIODIC SURFACE GRATINGS
    VANDERSLUIS, P
    BINSMA, JJM
    VANDONGEN, T
    APPLIED PHYSICS LETTERS, 1993, 62 (24) : 3186 - 3188
12345