SCANNING ELECTRON ACOUSTIC MICROSCOPY OF INDENTATION-INDUCED CRACKS AND RESIDUAL-STRESSES IN CERAMICS

被引:36
|
作者
CANTRELL, JH
QIAN, ML
RAVICHANDRAN, MV
KNOWLES, KM
机构
[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND
[2] UNIV CAMBRIDGE,DEPT MAT SCI & MET,CAMBRIDGE CB2 3QZ,ENGLAND
关键词
D O I
10.1063/1.104019
中图分类号
O59 [应用物理学];
学科分类号
摘要
The ability of scanning electron acoustic microscopy (SEAM) to characterize ceramic materials is assessed. SEAM images of Vickers indentations in SiC whisker-reinforced alumina clearly reveal not only the radial cracks, the length of which can be used to estimate the fracture toughness of the material, but also reveal strong contrast, interpreted as arising from the combined effects of lateral cracks and the residual stress field left in the SiC whisker-reinforced alumina by the indenter. The strong contrast is removed after the material is heat treated at 1000 °C to relieve the residual stresses around the indentations. A comparison of these observations with SEAM and reflected polarized light observations of Vickers indentations in soda-lime glass both before and after heat treatment confirms our interpretation of the strong contrast.
引用
收藏
页码:1870 / 1872
页数:3
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