PROBING GUNN DOMAINS AT X-BAND MICROWAVE-FREQUENCIES USING A SCANNING MICROSCOPE

被引：13

作者：

HILL, MS ^{[1
]}

GOPINATH, A ^{[1
]}

机构：

[1] UNIV COLL N WALES,SCH ELECTR ENGN SCI,DEAN ST,BANGOR,CAERNARVONSHIRE,WALES

来源：

关键词：

D O I：

10.1088/0022-3727/7/1/315

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：69 / &

共 9 条

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NIXON, WC .

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[2]

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[3]

GOPINATH A, 1970, 7TH P INT C EL MICR, V1, P203

[4]

Hachenberg O., 1959, ADVAN ELECTRON ELECT, V11, P413

MACDONALD, NC ;

ROBINSON, GY ;

WHITE, RM .

[6] ISOLATION OF POTENTIAL CONTRAST IN SCANNING ELECTRON MICROSCOPE [J].

OATLEY, CW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08) :742-&

[7] STROBOSCOPIC SCANNING ELECTRON MICROSCOPY [J].

PLOWS, GS ;

NIXON, WC .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (06) :595-&

ROBINSON, GY .

[9]

WELLS OC, 1972, 5TH P ANN SCANN EL M, P375