HOT-ELECTRON LUMINESCENCE IN IN0.53GA0.47AS TRANSISTOR CHANNEL

被引:4
作者
MASTRAPASQUA, M
BERTHOLD, G
CANALI, C
LURYI, S
ZANONI, E
MANFREDI, M
SIVCO, DL
CHO, AY
机构
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] UNIV PADUA,DIPARTIMENTO ELETTR & INFORMAT,I-35131 PADUA,ITALY
[3] UNIV MODENA,DIPARTIMENTO SCI INGN,I-41100 MODENA,ITALY
[4] UNIV PARMA,DIPARTIMENTO FIS,I-43100 PARMA,ITALY
关键词
D O I
10.1063/1.113206
中图分类号
O59 [应用物理学];
学科分类号
摘要
Measurements of light emission are reported in the 1.1-2.5 eV energy range, by hot electrons in the In0.53Ga0.47As channel of a complementary charge injection transistor. By comparing electrical characteristics and light emission, there is the ability to identify the intraconduction band transitions as the main light emission mechanism. Hot-electron effective temperatures up to 2200 K have been determined from high energy exponential tails of the electroluminescence spectra.© 1995 American Institute of Physics.
引用
收藏
页码:1376 / 1378
页数:3
相关论文
共 11 条
[1]  
BLAKAN N, 1993, 1992 P NATO ARW, P53
[2]   HOT-CARRIER LUMINESCENCE IN SI [J].
BUDE, J ;
SANO, N ;
YOSHII, A .
PHYSICAL REVIEW B, 1992, 45 (11) :5848-5856
[3]  
CANALI C, 1993, 1992 P NATO ARW, P215
[4]   HOT-ELECTRON-INDUCED PHOTON ENERGIES IN N-CHANNEL MOSFETS OPERATING AT 77-K AND 300-K [J].
LANZONI, M ;
MANFREDI, M ;
SELMI, L ;
SANGIORGI, E ;
CAPELLETTI, R ;
RICCO, B .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (05) :173-176
[5]   MULTITERMINAL LIGHT-EMITTING LOGIC DEVICE ELECTRICALLY REPROGRAMMABLE BETWEEN OR AND NAND FUNCTIONS [J].
MASTRAPASQUA, M ;
LURYI, S ;
BELENKY, GL ;
GARBINSKI, PA ;
CHO, AY ;
SIVCO, DL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (08) :1371-1377
[6]   LIGHT-EMITTING TRANSISTOR BASED ON REAL-SPACE TRANSFER - ELECTRICAL AND OPTICAL-PROPERTIES [J].
MASTRAPASQUA, M ;
LURYI, S ;
CAPASSO, F ;
HUTCHINSON, AL ;
SIVCO, DL ;
CHO, AY .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (02) :250-258
[7]   IMPACT IONIZATION AND LIGHT-EMISSION IN GAAS METAL-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS [J].
NEVIANI, A ;
TEDESCO, C ;
ZANONI, E ;
CANALI, C ;
MANFREDI, M ;
CETRONIO, A .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (06) :4213-4220
[8]  
SELMI L, 1993, 1993 IEEE IEDM, P531
[9]   IMPACT IONIZATION AND REAL-SPACE TRANSFER OF MINORITY-CARRIERS IN CHARGE INJECTION TRANSISTORS [J].
TEDESCO, C ;
MASTRAPASQUA, M ;
CANALI, C ;
LURYI, S ;
MANFREDI, M ;
ZANONI, E ;
SIVCO, DL ;
CHO, AY .
IEEE ELECTRON DEVICE LETTERS, 1994, 15 (10) :377-379
[10]   HOT-CARRIER EVALUATION OF MOSFETS IN ULSI CIRCUITS USING THE PHOTON-EMISSION METHOD [J].
URAOKA, Y ;
TSUTSU, N ;
MORII, T ;
TSUJI, K .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (08) :1426-1431