DETERMINATION OF ATOMIC POSITIONS USING ELECTRON NANODIFFRACTION PATTERNS FROM OVERLAPPING REGIONS - SI[110]

被引：26

作者：

KONNERT, J ^{[1
]}

DANTONIO, P ^{[1
]}

COWLEY, JM ^{[1
]}

HIGGS, A ^{[1
]}

OU, HJ ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85281

来源：

ULTRAMICROSCOPY | 1989年 / 30卷 / 03期

关键词：

D O I：

10.1016/0304-3991(89)90068-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：371 / 384

页数：14

相关论文

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[1] EXTENSION OF SCANNING-TRANSMISSION ELECTRON-MICROSCOPY BY USE OF DIFFRACTION INFORMATION [J].

COWLEY, JM .

ULTRAMICROSCOPY, 1976, 1 (03) :255-262

[2] MICRODIFFRACTION AND STEM OF INTERFACES [J].

COWLEY, JM .

ULTRAMICROSCOPY, 1984, 14 (1-2) :27-36

[3] IMAGE-RECONSTRUCTION USING ELECTRON MICRODIFFRACTION PATTERNS FROM OVERLAPPING REGIONS [J].

KONNERT, J ;

DANTONIO, P .

ULTRAMICROSCOPY, 1986, 19 (03) :267-277

[4]

HIGH RESOLUTION ELEC