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- [2] FAR-ULTRAVIOLET REFLECTANCE MEASUREMENTS AND OPTICAL-CONSTANTS OF UNOXIDIZED ALUMINUM FILMS APPLIED OPTICS, 1995, 34 (22): : 4892 - 4899
- [4] MEASUREMENT OF OPTICAL-CONSTANTS OF FILMS DURING THEIR DEPOSITION SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1988, 55 (02): : 121 - 123
- [5] PRECISION IN THE ELLIPSOMETRIC DETERMINATION OF THE OPTICAL-CONSTANTS OF VERY THIN-FILMS APPLIED OPTICS, 1982, 21 (16): : 2968 - 2971
- [10] ELLIPSOMETRIC METHOD OF DETERMINING THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON FILMS INDUSTRIAL LABORATORY, 1989, 55 (08): : 949 - 951