PRECISION DETERMINATION OF LATTICE CONSTANTS WITH A GEIGER-COUNTER X-RAY DIFFRACTOMETER

被引：120
作者：
SMAKULA, A
KALNAJS, J
机构：
来源：
PHYSICAL REVIEW | 1955年 / 99卷 / 06期
关键词：
D O I：
10.1103/PhysRev.99.1737
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
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页码：1737 / 1743
页数：7
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共 24 条
[1]   THE CONVERSION FACTOR FOR KX UNITS TO ANGSTROM UNITS [J].
BRAGG, WL .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1947, 24 (01) :27-27
[2]  
BRAGG WL, 1948, ACTA CRYSTALLOGR, V1, P46
[3]  
CAUCHOIS Y, 1947, TABLES CONSTANTES DO
[4]   EFFECT OF VERTICAL DIVERGENCE ON THE DISPLACEMENT AND BREADTH OF X-RAY POWDER DIFFRACTION LINES [J].
EASTABROOK, JN .
BRITISH JOURNAL OF APPLIED PHYSICS, 1952, 3 (NOV) :349-352
[5]  
HAMACHER EA, 1951, 42 PHIL LAB TECHN RE
[6]   THE LATTICE CONSTANTS AND EXPANSION COEFFICIENTS OF SOME HALIDES [J].
HAMBLING, PG .
ACTA CRYSTALLOGRAPHICA, 1953, 6 (01) :98-98
[7]  
Ievins A, 1936, Z PHYS CHEM B-CHEM E, V34, P402
[8]   Precision determination of lattice constants [J].
Jette, ER ;
Foote, F .
JOURNAL OF CHEMICAL PHYSICS, 1935, 3 (10) :605-616
[9]  
KLUG HP, 1954, XRAY DIFFRACTION PRO
[10]  
Lipson H, 1944, PHILOS MAG, V35, P544
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