COMPUTER-CONTROLLED TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS

被引：43
作者：
HALL, TM
WAGNER, A
SEIDMAN, DN
机构：
[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853
[2] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1977年 / 10卷 / 09期
关键词：
D O I：
10.1088/0022-3735/10/9/013
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：884 / 893
页数：10
相关论文
共 52 条
[1]  
ANDREN HO, 1975, 22ND P INT FIELD EM
[2]   QUANTITATIVE STUDY OF VACANCY DEFECTS IN QUENCHED PLATINUM BY FIELD-ION MICROSCOPY AND ELECTRICAL RESISTIVITY .1. EXPERIMENTAL RESULTS [J].
BERGER, AS ;
SEIDMAN, DN ;
BALLUFFI, RW .
ACTA METALLURGICA, 1973, 21 (02) :123-135
[3]   10-NSEC RESOLUTION COUNTER FOR MULTIPARTICLE ATOM PROBE TIME-OF-FLIGHT MEASUREMENTS [J].
BERGER, AS .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (05) :592-594
[4]   AUSTENITIC STAINLESS-STEELS WITH IMPROVED RESISTANCE TO RADIATION-INDUCED SWELLING [J].
BLOOM, EE ;
STIEGLER, JO ;
ROWCLIFFE, AF ;
LEITNAKER, JM .
SCRIPTA METALLURGICA, 1976, 10 (04) :303-308
[5]   CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE [J].
BRENNER, SS ;
MCKINNEY, JT .
SURFACE SCIENCE, 1970, 23 (01) :88-&
[6]   FIM-ATOM PROBE ANALYSIS OF THIN NITRIDE PLATELETS IN FE-3 AT . PERCENT MO [J].
BRENNER, SS ;
GOODMAN, SR .
SCRIPTA METALLURGICA, 1971, 5 (10) :865-&
[7]   PERFORMANCE OF ELECTRON MULTIPLIERS IN FIM ATOM PROBES [J].
BRENNER, SS ;
MCKINNEY, JT .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (09) :1264-+
[8]   ON IONIZATION STATE OF FIELD EVAPORATED ATOMS AS MEASURED IN FIM-ATOM PROBE [J].
BRENNER, SS ;
MCKINNEY, JT .
APPLIED PHYSICS LETTERS, 1968, 13 (01) :29-&
[9]  
CHAMBERS RS, 1975, 22ND P INT FIELD EM, P74
[10]  
CHANG WH, 1963, HIGH TEMPERATURE MAT, P347
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