VARIATION OF SECONDARY-ELECTRON YIELD IN THE FRACTURED SURFACE OF MELT-TEXTURED GROWTH YBCO SUPERCONDUCTOR WITH Y2BACUO5 GRAINS UNDER A SCANNING ELECTRON-MICROSCOPE IN THE TEMPERATURE-RANGE 81-300-K

被引：0
作者：
CHOW, JCL
FUNG, PCW
机构：
[1] Department of Physics, The University of Hong Kong
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1995年 / 14卷 / 02期
关键词：
D O I：
10.1007/BF00456559
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
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页码：99 / 101
页数：3
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