HIGH-RESOLUTION, LOW-ENERGY AVALANCHE PHOTODIODE X-RAY-DETECTORS

被引：35

作者：

FARRELL, R

VANDERPUYE, K

ENTINE, G

SQUILLANTE, MR

机构：

[1] Radiation Monitoring Devices, Inc., Watertown, MA, 02172

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1991年 / 38卷 / 02期

基金：

美国国家航空航天局;

关键词：

D O I：

10.1109/23.289288

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Silicon avalanche photodiodes have been fabricated and their performance as X-ray detectors has been measured. Photon sensitivity and energy resolution was measured as a function of size and operating parameters. Noise thresholds as low as 212 eV were obtained at room temperature and backscatter X-ray fluorescence data was obtained for aluminum and other light elements.

引用

收藏

页码：144 / 147

页数：4

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